Thermal Noise in Field-Effect Transistors

• A. Der Ziel

収録刊行物

• Proceedings of the IRE

  Proceedings of the IRE 50 (8), 1808-1812, 1962-08

  Institute of Electrical and Electronics Engineers (IEEE)

キーワード

• Electrical and Electronic Engineering

詳細情報

• CRID: 1360292620060727040
• NII論文ID: 30025205282
• DOI: 10.1109/jrproc.1962.288221
• ISSN: 00968390
• Web Site: http://xplorestaging.ieee.org/ielx5/10933/4066917/04066927.pdf?arnumber=4066927
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