書誌事項
- タイトル別名
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- Analytical Simulation of I-V Characteristics for Self-Biased Channel Diode
- ジコ バイアスチャネルダイオード ノ デンリュウ デンアツ トクセイ カイセキ シミュレーション
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A self-biased channel diode (SBCD) that self-biases a channel diode using a DMOSFET structure has recently been proposed. In the present paper, an analytical simulation method, based on a drift-diffusion model that takes into account the physics of the SBCD, is described and the simulation results are presented. The simulation results are seen to be in good agreement with the experimental results. An increase ratio of a reverse leakage current of the SBCD for temperature is significantly less than that of the Schottky barrier diode (SBD). This relative insensitivity of the SBCD reverse current to rising temperature can be explained in terms of the temperature dependence of the parameters composed of the reverse leakage current by the analytical simulation. Furthermore, the power loss is simulated for a SBCD with a thin gate oxide layer, integrated into a high-density DMOSFET cell. The SBCD impurity profile is chosen to correspond to an approximate minimum power loss at 75°C for a gate oxide thickness of 3nm. Under these conditions, the SBCD exhibits a power loss intermediate between that of the Ti-SBD and Cr-SBD in the temperature range 25-75°C. However, at high temperatures, the power loss in the SBCD is lower than that for the Ti-SBD or Cr-SBD, which easily undergo thermal runaway.
収録刊行物
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- 電気学会論文誌Ｃ（電子・情報・システム部門誌）
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電気学会論文誌Ｃ（電子・情報・システム部門誌） 132 (9), 1429-1436, 2012
一般社団法人 電気学会
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詳細情報 詳細情報について
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- CRID
- 1390282679584485760
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- NII論文ID
- 10031019429
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- NII書誌ID
- AN10065950
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- ISSN
- 13488155
- 03854221
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- NDL書誌ID
- 023974101
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
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