書誌事項
- タイトル別名
-
- Measurements of Field Electron Emission Sites Distribution for Oxygen Free Copper Electrodes and Microscopic Observations of Emission Sites
- ムサンソ ドウ デンキョク ニ オケル デンカイ デンシ ホウシュツテン ノ ブンプ ソクテイ ト デンシ ホウシュツ カショ ノ ビシテキ カンサツ
この論文をさがす
抄録
Electron emission is one of causes leading to electrical breakdown in vacuum. Distributions of field emission sites on a plane electrode before and after current conditioning procedure were investigated by using an Electron Emission Microscope. After the investigation of emission sites distribution, microscopic observation on some of the emission sites were carried out by using an Electron Emission Microscope. The observation revealed that field emission occurs at the foreign particles embedded on the electrode surface. To characterize the emission sites, we observed the absorption current image and analyzed the chemical composition of the emission sites by using an auger electron spectrometer. Observation and analysis suggest that the foreign particle was a semiconducting or insulating material composed of carbon.
収録刊行物
-
- 電気学会論文誌． Ａ
-
電気学会論文誌． Ａ 132 (11), 958-964, 2012
一般社団法人 電気学会
- Tweet
詳細情報 詳細情報について
-
- CRID
- 1390001204599437952
-
- NII論文ID
- 10031120059
-
- NII書誌ID
- AN10136312
-
- ISSN
- 13475533
- 03854205
-
- NDL書誌ID
- 024080577
-
- 本文言語コード
- ja
-
- データソース種別
-
- JaLC
- NDL
- Crossref
- CiNii Articles
-
- 抄録ライセンスフラグ
- 使用不可