Evaluation of Vacuum Ultraviolet Irradiation Influence under Xenon Excimer Lamp Processing Employing a Quartz Crystal Microbalance with Organic Thin Film

• Kiyoshi Yoshino

• Hiroyuki Matsumoto

• Tatsuyuki Iwasaki

書誌事項

タイトル別名

• Special Issue : Printed Electronics

収録刊行物

• Japanese journal of applied physics : JJAP

  Japanese journal of applied physics : JJAP 52 (5), 2013-05

  Tokyo : The Japan Society of Applied Physics

詳細情報

• CRID: 1520853832796811776
• NII論文ID: 40019652135
• NII書誌ID: AA12295836
• ISSN: 00214922
• NDL書誌ID: 024523408
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I024523408
• 本文言語コード: en
• NDL 雑誌分類:
  • ZM35(科学技術--物理学)
• データソース種別:
  • NDL
  • CiNii Articles