Analysis of the Surface Coverage of a Self-Assembled Monolayer of Octadecyl Silane on a Si(100) Surface by Infrared External-Reflection Spectroscopy

• NORIMOTO Shingo

  Laboratory of Solution and Interface Chemistry, Division of Environmental Chemistry, Institute for Chemical Research, Kyoto University

• MORIMINE Seiya

  Laboratory of Solution and Interface Chemistry, Division of Environmental Chemistry, Institute for Chemical Research, Kyoto University

• SHIMOAKA Takafumi

  Laboratory of Solution and Interface Chemistry, Division of Environmental Chemistry, Institute for Chemical Research, Kyoto University

• HASEGAWA Takeshi

  Laboratory of Solution and Interface Chemistry, Division of Environmental Chemistry, Institute for Chemical Research, Kyoto University

抄録

The coverage of a self-assembled monolayer (SAM) of octadecyl silane on a silicon surface is analyzed by infrared external-reflection spectrometry via molecular orientation analysis. A commercially available octadecyl trimethoxy silane (ODS) solution is employed, which readily reacts with an oxidized surface of Si(100) prepared by a UV/ozone treatment in an ambient condition to yield a highly reproducible SAM. With the present technique, a very flat surface with no holes is obtained in the entire area of the SAM. IR external-reflection spectra of the SAM apparently indicate that the alkyl chains are highly ordered having the all-trans zigzag conformation, and the molecular orientation agrees with that of a Langmuir–Blodgett (LB) monolayer film of octadecanoic acid. Since the orientation analysis is based on an assumption that the surface is fully covered by the SAM as the LB film, the agreement of the orientation confirms that the surface coverage of the present SAM on Si(100) is on the same level as the LB film.

収録刊行物

• Analytical Sciences

  Analytical Sciences 29 (10), 979-984, 2013

  社団法人 日本分析化学会

キーワード

• Self-assembled monolayer
• surface coverage
• silicon surface
• infrared external-reflection spectroscopy
• surface selection rule
• atomic force microscope

詳細情報

• CRID: 1390282679236699520
• NII論文ID: 10031202858
• NII書誌ID: AA10500785
• DOI: 10.2116/analsci.29.979
• COI: 1:STN:280:DC%2BC2c%2FmsVGrtQ%3D%3D
• ISSN: 13482246
• ISSN: 09106340
• NDL書誌ID: 024914000
• PubMed: 24107563
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I024914000
• Web Site: https://link.springer.com/content/pdf/10.2116/analsci.29.979.pdf
• Web Site: https://link.springer.com/article/10.2116/analsci.29.979/fulltext.html
• Web Site: https://www.jstage.jst.go.jp/article/analsci/29/10/29_979/_pdf
• 本文言語コード: en
• データソース種別:
  • JaLC
  • NDL
  • Crossref
  • PubMed
  • CiNii Articles
  • KAKEN
• 抄録ライセンスフラグ: 使用不可