Temperature Dependent Current-Voltage and Capacitance-Voltage Characteristics of an Au/n-Type Si Schottky Barrier Diode Modified Using a PEDOT:PSS Interlayer
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- Khurelbaatar Zagarzusem
- School of Semiconductor and Chemical Engineering, Semiconductor Physics Research Center (SPRC), Chonbuk National University
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- Shim Kyu-Hwan
- School of Semiconductor and Chemical Engineering, Semiconductor Physics Research Center (SPRC), Chonbuk National University
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- Cho Jaehee
- School of Semiconductor and Chemical Engineering, Semiconductor Physics Research Center (SPRC), Chonbuk National University
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- Hong Hyobong
- IT Convergence Technology Research Laboratory, Electronics & Telecommunication Research Institute
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- Reddy V. Rajagopal
- Department of Physics, Sri Venkateswara University
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- Choi Chel-Jong
- School of Semiconductor and Chemical Engineering, Semiconductor Physics Research Center (SPRC), Chonbuk National University
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The temperature dependence of the current-voltage (I-V) and capacitance-voltage (C-V) characteristics of an Au/n-type Si Schottky barrier diode (SBD) with a PEDOT:PSS interlayer was investigated. The SBD parameters, such as Schottky barrier height (ΦB), ideality factor (n), saturation current (I0), doping concentration (ND), and series resistance (Rs), were obtained as a function of temperature. The Richardson constant (A**) obtained from the In(Io/T2) versus 1000/T plot was much less than the theoretical value for n-Si. The mean Schottky barrier height (\barΦ bo) and standard deviation (σ0) calculated using the apparent Schottky barrier height (Φap) versus 1/2kT plot were 1.26 eV and 0.15 eV, respectively. From a fit of the modified Richardson plot of ln(I0/T2) − (qσ)2/2(kT)2 versus 1000/T, the A** was extracted as 134 A/cm2 K2, which was close to the theoretical value of the n-Si. The interface state densities obtained from the Au/PEDOT:PSS/n-Si SBD decreased with increasing temperature. Furthermore, the conduction mechanism dominating the reverse-bias leakage current in Au/PEDOT:PSS/n-Si SBD was described and discussed.
収録刊行物
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- MATERIALS TRANSACTIONS
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MATERIALS TRANSACTIONS 56 (1), 10-16, 2015
公益社団法人 日本金属学会
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詳細情報 詳細情報について
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- CRID
- 1390001204252710656
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- NII論文ID
- 40020318806
- 130004704639
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- NII書誌ID
- AA1151294X
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- ISSN
- 13475320
- 13459678
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- NDL書誌ID
- 026013863
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
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