書誌事項
- タイトル別名
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- Quantitative Evaluation of Resolution-Level Local-Micro Deformation Based on Three Dimensional Microstructure Images
- サンジゲン ザイリョウ ソシキ ガゾウ ニ モトズク カイゾウド ニ チカイ ビショウ ヘンケイ ノ テイリョウ ヒョウカ
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抄録
In order to quantitative evaluation of micro strain which is close to the resolution of images, a novel evaluation method using three dimensional microstructure images is proposed in this study, especially for the purpose to use in-house micro-focused X-ray tomography apparatus with the resolution of 1-5 μm. The evaluation method is composed of two parts. One is a conventional calculation method to evaluate deformation and the other is a quantitative evaluation of error which is generated by apparatus resolution. By applying this method to NiMnGa/silicone composite under 5% compression strain, 6.4±1 μm deformation of NiMnGa particle is determined under the conditions of 6 specific points and the apparatus resolution of 1.67 μm. Then, the present evaluation method is concluded to be the useful and strong calculation way for the quantitative understanding of resolution-level local-micro deformation, especially based on in-house micro-focused X-ray computed tomography.<br>
収録刊行物
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- 日本金属学会誌
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日本金属学会誌 80 (1), 85-91, 2015
公益社団法人 日本金属学会
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詳細情報 詳細情報について
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- CRID
- 1390001206481800064
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- NII論文ID
- 130005115564
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- NII書誌ID
- AN00187860
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- ISSN
- 18806880
- 24337501
- 00214876
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- NDL書誌ID
- 027051795
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
- KAKEN
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- 抄録ライセンスフラグ
- 使用不可