書誌事項
- タイトル別名
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- Structural Analysis of Native Passive Films on Stainless Steels Using Synchrotron X-ray Spectroscopy
- ホウシャコウ Xセン ブンコウ オ クシ シタ ステンレスコウ ヒョウメン ニ オケル シゼン フドウタイ ヒマク ノ コウゾウ カイセキ
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抄録
<p>A native passive film is formed on the SUS304 surface at ordinary temperature and pressure1, 2). As a structural model of the film, a network-structure composed of Cr-oxide and -hydroxide has ever been proposed1, 3), but experimental evidences for the structure have not been reported yet. We examined the detailed film structure using synchrotron X-ray absorption fine structure (XAFS) and X-ray photoelectron spectroscopy (XPS). The XAFS spectra clearly showed an ordered network-structure (at least < 10 Å) of Cr(IV) oxide. Additionally, the XPS spectra indicated that the chromium oxide is transformed into a chromium oxyhydroxide such as a -O-Cr-OH- structure. These results are the first evidence that the network structure exists actually in the native passive film of SUS304.</p>
収録刊行物
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- 表面科学
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表面科学 37 (9), 422-428, 2016
公益社団法人 日本表面科学会
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詳細情報 詳細情報について
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- CRID
- 1390282681433608064
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- NII論文ID
- 130005416241
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- NII書誌ID
- AN00334149
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- ISSN
- 18814743
- 03885321
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- NDL書誌ID
- 027655540
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可