Cryo-TOF-SIMSによる植物試料のケミカルイメージング

• 青木 弾

  名古屋大学大学院生命農学研究科

• 松下 泰幸

  名古屋大学大学院生命農学研究科

• 福島 和彦

  名古屋大学大学院生命農学研究科

書誌事項

タイトル別名

• Chemical Imaging of Plant Samples by Cryo-TOF-SIMS
• Cryo-TOF-SIMS ニ ヨル ショクブツ シリョウ ノ ケミカルイメージング

抄録

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been recognized gradually as a powerful analytical tool for plant materials. The availability of TOF-SIMS measurements in a research field of plant science is briefly introduced. Main polymer components of plant cell wall, cellulose, hemicellulose, and lignin are detected as fragment ions. Inorganics and low molecular-weight extractives are detectable as elemental and molecular ions. In living plant materials, there are various water-soluble organic/inorganic chemicals. There is a strong apprehension that such water-soluble chemicals can be moved by the sample preparation process of trimming, sectioning, and drying. Recently, the author and co-workers have analyzed freeze-fixed plant samples by cryo-TOF-SIMS. The latest topics of cryo-TOF-SIMS dealing with frozen-hydrated samples are introduced.

収録刊行物

• 表面科学

  表面科学 37 (12), 599-603, 2016

  公益社団法人 日本表面科学会

キーワード

• cryo-TOF-SIMS
• lignin
• coniferin
• extractives
• inorganic metals

詳細情報

• CRID: 1390282681435510784
• NII論文ID: 130005434925
• NII書誌ID: AN00334149
• DOI: 10.1380/jsssj.37.599
• ISSN: 18814743
• ISSN: 03885321
• NDL書誌ID: 027791197
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I027791197
• Web Site: https://www.jstage.jst.go.jp/article/jsssj/37/12/37_599/_pdf
• 本文言語コード: ja
• データソース種別:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• 抄録ライセンスフラグ: 使用不可