Investigation of quantum interference effects in Bi and Sb films and mesoscopic structures Bi-Sbの超薄膜とメゾスコピック構造における量子干渉効果の研究

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Author

    • 劉, 翊 リュウ, イ

Bibliographic Information

Title

Investigation of quantum interference effects in Bi and Sb films and mesoscopic structures

Other Title

Bi-Sbの超薄膜とメゾスコピック構造における量子干渉効果の研究

Author

劉, 翊

Author(Another name)

リュウ, イ

University

大阪大学

Types of degree

理学博士

Grant ID

甲第4211号

Degree year

1990-09-30

Note and Description

博士論文

Table of Contents

  1. CONTENTS / p1 (0003.jp2)
  2. Abstract / p2 (0004.jp2)
  3. Chapter I. Introduction / p3 (0005.jp2)
  4. Chapter II. Theory of Localization Effects in Macroscopic System / p6 (0008.jp2)
  5. 2-1. Anderson localization and scaling theory / p7 (0009.jp2)
  6. 2-2. Weak localization theory / p11 (0013.jp2)
  7. 2-3. Weak localization theory in mesoscopic range / p15 (0017.jp2)
  8. Chapter III. Theory of Quantum Interference Effects in Mesoscopic System / p17 (0019.jp2)
  9. 3-1. Landauer-type formulation / p19 (0021.jp2)
  10. 3-2. The Aharonov-Bohm effect(h/2e and h/e oscillations) / p24 (0026.jp2)
  11. 3-3. Conductance fluctuations / p29 (0031.jp2)
  12. 3-4. Symmetry of magnetoconductance / p36 (0038.jp2)
  13. 3-5. Voltage fluctuations / p40 (0042.jp2)
  14. Chapter IV. Measurements of Localization Effect in Films / p46 (0048.jp2)
  15. 4-1. Sample preparation and experimental / p46 (0048.jp2)
  16. 4-2. Antilocalization effect in Bi films / p50 (0052.jp2)
  17. 4-3. Antilocalization effect in Sb films / p53 (0055.jp2)
  18. 4-4. Antilocalization effect in Bi-Sb films / p56 (0058.jp2)
  19. Chapter V. Measurements of Quantum Effects in Mesoscopic Structure / p59 (0061.jp2)
  20. 5-1. Sample preparation and experimental / p59 (0061.jp2)
  21. 5-2. Conductance fluctuations in Bi wires / p64 (0066.jp2)
  22. 5-3. Symmetry of magnetoconductance and voltage fluctuations in Bi wires / p71 (0073.jp2)
  23. 5-4. The AB effects in Bi wires and rings / p75 (0077.jp2)
  24. 5-5. Antilocalization effect in Bi mesoscopic samples / p77 (0079.jp2)
  25. Chapter VI. Conclusion / p79 (0081.jp2)
  26. Acknowledgments / p82 (0084.jp2)
  27. References / p83 (0085.jp2)
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Codes

  • NII Article ID (NAID)
    500000072567
  • NII Author ID (NRID)
    • 8000000072762
  • DOI(NDL)
  • Text Lang
    • und
  • NDLBibID
    • 000000236881
  • Source
    • Institutional Repository
    • NDL ONLINE
    • NDL Digital Collections

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