Fundamental studies on the interactions of kV electrons with solids for applications to electron spectroscopies 電子分光法におけるkV電子と固体との相互作用に関する基礎的研究

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Author

    • 丁, 澤軍 ディン, ツェジュン

Bibliographic Information

Title

Fundamental studies on the interactions of kV electrons with solids for applications to electron spectroscopies

Other Title

電子分光法におけるkV電子と固体との相互作用に関する基礎的研究

Author

丁, 澤軍

Author(Another name)

ディン, ツェジュン

University

大阪大学

Types of degree

工学博士

Grant ID

乙第5163号

Degree year

1990-10-29

Note and Description

博士論文

Table of Contents

  1. CONTENTS / p5 (0005.jp2)
  2. List of Acronyms / p8 (0007.jp2)
  3. Preface and Acknowledgments / p9 (0007.jp2)
  4. 1. Introduction / p1 (0009.jp2)
  5. §1.1 Electron Spectroscopies for Surface Analysis / p1 (0009.jp2)
  6. §1.2 Electron-Solid Interactions / p7 (0012.jp2)
  7. 2. Theory of Electron Scattering / p15 (0016.jp2)
  8. §2.1 Calculation of Elastic Cross-Sections / p15 (0016.jp2)
  9. §2.2 Inelastic Scattering / p29 (0023.jp2)
  10. 3. Monte Carlo Simulation / p66 (0042.jp2)
  11. §3.1 Principles / p66 (0042.jp2)
  12. §3.2 Models / p68 (0043.jp2)
  13. §3.3 Procedures / p72 (0045.jp2)
  14. 4. Application of Monte Carlo Simulation I. / p82 (0050.jp2)
  15. (Backscattering Factors for Quantitative Auger Analysis) / p82 (0050.jp2)
  16. §4.1 Formalisms of Quantitative Analysis by Auger Electron Spectroscopy / p82 (0050.jp2)
  17. §4.2 Backscattering Factors for Au-Cu Alloy / p85 (0051.jp2)
  18. §4.3 Estimation of Background in Auger Electron Spectroscopy / p95 (0056.jp2)
  19. 5. Application of Monte Carlo Simulation II. / p105 (0061.jp2)
  20. (Generation of Secondary Electrons) / p105 (0061.jp2)
  21. §5.1 Secondary Electron Emission / p105 (0061.jp2)
  22. §5.2 Monte Carlo Calculations / p109 (0063.jp2)
  23. §5.3 Ultimate Resolution of Scanning Electron Microscopy / p113 (0065.jp2)
  24. 6. Application of Monte Carlo Simulation III. / p126 (0072.jp2)
  25. (Escape Depth and Attenuation Length) / p126 (0072.jp2)
  26. §6.1 Introduction / p126 (0072.jp2)
  27. §6.2 Assessment of Escape Depth and Attenuation Length without Elastic Scattering / p129 (0073.jp2)
  28. §6.3 Correction Factor for Escape Depth in Quantitative Auger Analysis / p137 (0077.jp2)
  29. §6.4 Estimation of Attenuation Length / p145 (0081.jp2)
  30. 7. Angular-Energy Distribution of Backscattered Electrons / p149 (0083.jp2)
  31. §7.1 Introduction / p149 (0083.jp2)
  32. §7.2 Construction of Experimental Apparatus / p151 (0084.jp2)
  33. §7.3 Performance of Measuring System / p155 (0086.jp2)
  34. §7.4 Measurements of Angular Distribution / p156 (0087.jp2)
  35. §7.5 Comparison with Calculations / p163 (0090.jp2)
  36. §7.6 Angular Resolved Energy Distribution / p169 (0093.jp2)
  37. 8. Summary / p171 (0094.jp2)
  38. Appendices / p175 (0096.jp2)
  39. §A. Mott Cross-Sections / p175 (0096.jp2)
  40. §B. Expansion of Radial Functions / p181 (0099.jp2)
  41. §C. Atomic Potentials / p184 (0101.jp2)
  42. §D. Born Approximation / p188 (0103.jp2)
  43. §E. Dielectric Approach / p191 (0104.jp2)
  44. §F. Coordinate Transformations / p197 (0107.jp2)
  45. §G. Angular Distribution / p200 (0109.jp2)
  46. §H. Detection Solid Angles for Cylindrical Mirror Analyzer / p202 (0110.jp2)
  47. §I. Integrals / p204 (0111.jp2)
  48. References / p209 (0113.jp2)
  49. List of Publications / p218 (0118.jp2)
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Codes

  • NII Article ID (NAID)
    500000072617
  • NII Author ID (NRID)
    • 8000000072812
  • DOI(NDL)
  • Text Lang
    • und
  • NDLBibID
    • 000000236931
  • Source
    • Institutional Repository
    • NDL ONLINE
    • NDL Digital Collections

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