X-ray characterization of a lapped asymmetrical silicon crystal for an intravenous coronary angiography system using synchrotron radiation X-Ray Characterization of a Lapped AsymmetricalSilicon Crystal for an Intravenous CoronaryAngiography System Using Synchrotron Radiation
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著者
書誌事項
- タイトル
-
X-ray characterization of a lapped asymmetrical silicon crystal for an intravenous coronary angiography system using synchrotron radiation
- タイトル別名
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X-Ray Characterization of a Lapped AsymmetricalSilicon Crystal for an Intravenous CoronaryAngiography System Using Synchrotron Radiation
- 著者名
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塩飽, 秀啓
- 著者別名
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シワク, ヒデアキ
- 学位授与大学
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総合研究大学院大学
- 取得学位
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学術博士
- 学位授与番号
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甲第8号
- 学位授与年月日
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1992-03-16
注記・抄録
博士論文
総研大甲第8号
目次
- CONTENTS / (0003.jp2)
- Chapter I Introduction / p1 (0005.jp2)
- I-1 K-edge subtraction system using synchrotron radiation and its significance for clinical medicine / p2 (0006.jp2)
- I-2 X-ray optics for increasing the integrated intensity / p5 (0009.jp2)
- Chapter II Purpose of research / p6 (0010.jp2)
- Chapter III Sample crystals / p9 (0013.jp2)
- III-1 Preparation / p10 (0014.jp2)
- III-2 Abrasives for lapping / p13 (0017.jp2)
- III-3 Lapping of crystals / p28 (0032.jp2)
- Chapter IV Measurement of rocking curves / p30 (0034.jp2)
- IV-1 Experimental system / p31 (0035.jp2)
- IV-2 Data analysis / p36 (0040.jp2)
- IV-3 Si(111)and(311)channel-cut monochromator / p40 (0044.jp2)
- IV-4 Experimental conditions / p46 (0050.jp2)
- IV-5 Results of measurements / p48 (0052.jp2)
- IV-6 Discussion / p66 (0070.jp2)
- Chapter V Characterization of a lapped layer structure / p68 (0072.jp2)
- V-1 Observation by electron microscopy / p69 (0073.jp2)
- V-2 Diffraction from asymmetrical Si(311)with 9.66 keV / p74 (0078.jp2)
- V-3 The curve fitting of rocking curves / p78 (0082.jp2)
- V-4 Discussion / p105 (0109.jp2)
- Chapter VI Evaluation of image quality for a lapped crystal / p108 (0112.jp2)
- Chapter VII Summary / p124 (0128.jp2)
- Acknowledgements / p127 (0131.jp2)
- References / p128 (0132.jp2)
- Appendix / p131 (0135.jp2)
