Determination of atomic form factors by means of coherent bremsstrahlung コヒーレント制動放射を用いた原子散乱因子の決定
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Bibliographic Information
- Title
-
Determination of atomic form factors by means of coherent bremsstrahlung
- Other Title
-
コヒーレント制動放射を用いた原子散乱因子の決定
- Author
-
飛山, 真理
- Author(Another name)
-
トビヤマ, マコト
- University
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広島大学
- Types of degree
-
理学博士
- Grant ID
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乙第2288号
- Degree year
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1992-07-27
Note and Description
博士論文
Contents / p1 1 Introduction / p4 2 Coherent Bremsstrahlung / p7 2.1 Theoretical foundation / p7 2.2 Dip-bump structures / p12 2.3 Effect of the atomic form factor / p14 3 Experimental Set-up / p15 3.1 General consideration / p15 3.2 Electron synchrotron / p17 3.3 Tagging system and electron monitor / p17 3.4 Target and goniometer / p20 3.5 Data acquisition methods / p22 4 Experimental Procedure / p22 4.1 Check runs / p22 4.2 Silicon runs / p25 4.3 Aluminum runs / p26 5 Results and discussion / p28 5.1 Theoretical calculation / p28 5.2 Atomic form factor of silicon crystal / p30 5.3 Effect of the imperfection of silicon crystal / p36 5.4 Atomic form factor of aluminum crystal / p38 5.5 Possible improvement of experimental methods / p42 6 Conclusion / p43
Table of Contents
- Contents / p1 (0004.jp2)
- 1 Introduction / p4 (0007.jp2)
- 2 Coherent Bremsstrahlung / p7 (0010.jp2)
- 2.1 Theoretical foundation / p7 (0010.jp2)
- 2.2 Dip-bump structures / p12 (0015.jp2)
- 2.3 Effect of the atomic form factor / p14 (0017.jp2)
- 3 Experimental Set-up / p15 (0018.jp2)
- 3.1 General consideration / p15 (0018.jp2)
- 3.2 Electron synchrotron / p17 (0020.jp2)
- 3.3 Tagging system and electron monitor / p17 (0020.jp2)
- 3.4 Target and goniometer / p20 (0023.jp2)
- 3.5 Data acquisition methods / p22 (0025.jp2)
- 4 Experimental Procedure / p22 (0025.jp2)
- 4.1 Check runs / p22 (0025.jp2)
- 4.2 Silicon runs / p25 (0028.jp2)
- 4.3 Aluminum runs / p26 (0029.jp2)
- 5 Results and discussion / p28 (0031.jp2)
- 5.1 Theoretical calculation / p28 (0031.jp2)
- 5.2 Atomic form factor of silicon crystal / p30 (0033.jp2)
- 5.3 Effect of the imperfection of silicon crystal / p36 (0039.jp2)
- 5.4 Atomic form factor of aluminum crystal / p38 (0041.jp2)
- 5.5 Possible improvement of experimental methods / p42 (0045.jp2)
- 6 Conclusion / p43 (0046.jp2)
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- DETECTION OF RECOIL ELECTRONS IN TRIPLET PHOTOPRODUCTION / p144 (0071.jp2)
- Conceptual design of a 1.5-GeV x-ray ring / p1713 (0073.jp2)
- Suppression of Increase in Impurity in Single-Bunch Mode for the UVSOR Storage Ring / (0076.jp2)
- STUDY OF HARD-PHOTON EMISSION FROM 1.2 GeV ELECTRONS IN Si CRYSTAL / p150 (0078.jp2)
- Angular distribution of hard photons from 1.2GeV channeling electrons in Si / p1 (0082.jp2)