Determination of atomic form factors by means of coherent bremsstrahlung コヒーレント制動放射を用いた原子散乱因子の決定

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Author

    • 飛山, 真理 トビヤマ, マコト

Bibliographic Information

Title

Determination of atomic form factors by means of coherent bremsstrahlung

Other Title

コヒーレント制動放射を用いた原子散乱因子の決定

Author

飛山, 真理

Author(Another name)

トビヤマ, マコト

University

広島大学

Types of degree

理学博士

Grant ID

乙第2288号

Degree year

1992-07-27

Note and Description

博士論文

Contents / p1 1 Introduction / p4 2 Coherent Bremsstrahlung / p7  2.1 Theoretical foundation / p7  2.2 Dip-bump structures / p12  2.3 Effect of the atomic form factor / p14 3 Experimental Set-up / p15  3.1 General consideration / p15  3.2 Electron synchrotron / p17  3.3 Tagging system and electron monitor / p17  3.4 Target and goniometer / p20  3.5 Data acquisition methods / p22 4 Experimental Procedure / p22  4.1 Check runs / p22  4.2 Silicon runs / p25  4.3 Aluminum runs / p26 5 Results and discussion / p28  5.1 Theoretical calculation / p28  5.2 Atomic form factor of silicon crystal / p30  5.3 Effect of the imperfection of silicon crystal / p36  5.4 Atomic form factor of aluminum crystal / p38  5.5 Possible improvement of experimental methods / p42 6 Conclusion / p43

Table of Contents

  1. Contents / p1 (0004.jp2)
  2. 1 Introduction / p4 (0007.jp2)
  3. 2 Coherent Bremsstrahlung / p7 (0010.jp2)
  4. 2.1 Theoretical foundation / p7 (0010.jp2)
  5. 2.2 Dip-bump structures / p12 (0015.jp2)
  6. 2.3 Effect of the atomic form factor / p14 (0017.jp2)
  7. 3 Experimental Set-up / p15 (0018.jp2)
  8. 3.1 General consideration / p15 (0018.jp2)
  9. 3.2 Electron synchrotron / p17 (0020.jp2)
  10. 3.3 Tagging system and electron monitor / p17 (0020.jp2)
  11. 3.4 Target and goniometer / p20 (0023.jp2)
  12. 3.5 Data acquisition methods / p22 (0025.jp2)
  13. 4 Experimental Procedure / p22 (0025.jp2)
  14. 4.1 Check runs / p22 (0025.jp2)
  15. 4.2 Silicon runs / p25 (0028.jp2)
  16. 4.3 Aluminum runs / p26 (0029.jp2)
  17. 5 Results and discussion / p28 (0031.jp2)
  18. 5.1 Theoretical calculation / p28 (0031.jp2)
  19. 5.2 Atomic form factor of silicon crystal / p30 (0033.jp2)
  20. 5.3 Effect of the imperfection of silicon crystal / p36 (0039.jp2)
  21. 5.4 Atomic form factor of aluminum crystal / p38 (0041.jp2)
  22. 5.5 Possible improvement of experimental methods / p42 (0045.jp2)
  23. 6 Conclusion / p43 (0046.jp2)
  24. Determination of Atomic Form Factor of Silicon by Means of Coherent Bremsstrahlung of 1.2-GeV Electrons / p2292 (0069.jp2)
  25. DETECTION OF RECOIL ELECTRONS IN TRIPLET PHOTOPRODUCTION / p144 (0071.jp2)
  26. Conceptual design of a 1.5-GeV x-ray ring / p1713 (0073.jp2)
  27. Suppression of Increase in Impurity in Single-Bunch Mode for the UVSOR Storage Ring / (0076.jp2)
  28. STUDY OF HARD-PHOTON EMISSION FROM 1.2 GeV ELECTRONS IN Si CRYSTAL / p150 (0078.jp2)
  29. Angular distribution of hard photons from 1.2GeV channeling electrons in Si / p1 (0082.jp2)
3access

Codes

  • NII Article ID (NAID)
    500000091623
  • NII Author ID (NRID)
    • 8000000091848
  • DOI(NDL)
  • Text Lang
    • eng
  • NDLBibID
    • 000000255937
  • Source
    • Institutional Repository
    • NDL ONLINE
    • NDL Digital Collections
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