Theoretical study of small tunnel junctions 微小トンネル接合の理論的研究

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著者

    • 上田, 正仁, 1963- ウエダ, マサヒト

書誌事項

タイトル

Theoretical study of small tunnel junctions

タイトル別名

微小トンネル接合の理論的研究

著者名

上田, 正仁, 1963-

著者別名

ウエダ, マサヒト

学位授与大学

東京大学

取得学位

博士 (理学)

学位授与番号

乙第10423号

学位授与年月日

1991-11-25

注記・抄録

博士論文

identifier:oai:t2r2.star.titech.ac.jp:99002323

目次

  1. Contents / p5 (0006.jp2)
  2. 1.Introduction / p7 (0008.jp2)
  3. 2.Orthodox theory and beyond / p10 (0011.jp2)
  4. 2.1.Principle of Coulomb blockade / p10 (0011.jp2)
  5. 2.2.Single-electron-tunneling(SET)oscillations / p10 (0011.jp2)
  6. 2.3.Tunneling rate / p11 (0012.jp2)
  7. 2.4.Standard approaches to mesoscopic normal tunnel junctions / p12 (0013.jp2)
  8. 2.5.Physical meaning of fractional charge / p13 (0014.jp2)
  9. 2.6.Effects of the electromagnetic(EM)environment on Coulomb blockade / p13 (0014.jp2)
  10. 3.Probability-density-function description of mesoscopic tunnel junctions / p20 (0021.jp2)
  11. 3.1.Model and assumptions / p20 (0021.jp2)
  12. 3.2.Definitions of various probability distributions / p21 (0022.jp2)
  13. 3.3.Tunneling lifetime / p25 (0026.jp2)
  14. 3.4.Current-voltage characteristics / p26 (0027.jp2)
  15. 3.5.Relationship to the conventional master-equation approach / p28 (0029.jp2)
  16. 4.Standard quantum limit and shot noise of mesoscopic tunneling current / p29 (0030.jp2)
  17. 4.1.Degree of randomness of SET events / p29 (0030.jp2)
  18. 4.2.Constant-voltage operation-shot noise / p29 (0030.jp2)
  19. 4.3.Constant-current operation-standard quantum limit / p31 (0032.jp2)
  20. 4.4.Crossover from shot noise to standard quantum limit / p32 (0033.jp2)
  21. 5.Origin of the standard quantum limit / p33 (0034.jp2)
  22. 5.1.Time uncertainty-fluctuations in tunneling lifetimes / p33 (0034.jp2)
  23. 5.2.Energy uncertainty-fluctuations in Coulomb energy / p33 (0034.jp2)
  24. 5.3.Time-energy uncertainty relationship in tunneling / p34 (0035.jp2)
  25. 5.4.Breakdown of semiclassical theory of Coulomb blockade / p35 (0036.jp2)
  26. 6.Infrared divergence in single-electron tunneling / p37 (0038.jp2)
  27. 6.1.Effects of the"Fermi-surface"environment on tunneling / p37 (0038.jp2)
  28. 6.2.Formulation of the problem / p38 (0039.jp2)
  29. 6.3.Transient Green's functions at finite temperatures / p42 (0043.jp2)
  30. 6.4.Renormalized response function of the tunneling Hamiltonian / p47 (0048.jp2)
  31. 6.5.Determination of anomalous power exponent / p50 (0051.jp2)
  32. 7.Discussion and conclusions / p52 (0053.jp2)
  33. 8.Appendices / p55 (0056.jp2)
  34. A.Moments of normalized final charge[数式] / p55 (0056.jp2)
  35. B.Asymptotic expressions of[数式] / p56 (0057.jp2)
  36. C.Moments of charge[数式] / p57 (0058.jp2)
  37. D.Self-consistent treatment of divergent integrals / p59 (0060.jp2)
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各種コード

  • NII論文ID(NAID)
    500000098067
  • NII著者ID(NRID)
    • 8000000965419
  • DOI(NDL)
  • 本文言語コード
    • eng
  • NDL書誌ID
    • 000000262381
  • データ提供元
    • 機関リポジトリ
    • NDL ONLINE
    • NDLデジタルコレクション
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