Studies on the fault diagnosis of analog circuits アナログ回路の故障診断に関する研究

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Author

    • 林, 争輝 リン, ツェンフィ

Bibliographic Information

Title

Studies on the fault diagnosis of analog circuits

Other Title

アナログ回路の故障診断に関する研究

Author

林, 争輝

Author(Another name)

リン, ツェンフィ

University

東京大学

Types of degree

博士 (工学)

Grant ID

乙第10642号

Degree year

1992-03-16

Note and Description

博士論文

Table of Contents

  1. Contents / (0003.jp2)
  2. Chapter 1 Introduction / p1 (0004.jp2)
  3. 1-1 Backgroud of This Work / p1 (0004.jp2)
  4. 1-2 Motivations and Objectives of This Work / p11 (0009.jp2)
  5. 1-3 Synopese of Chapters / p17 (0012.jp2)
  6. References / p22 (0015.jp2)
  7. Chapter 2 Fundamentals of Fault Diagnosis / p29 (0018.jp2)
  8. 2-1 The Area of Analog Circuit Fault Diagnosis / p29 (0018.jp2)
  9. 2-2 Basic Concepts and Definitions / p31 (0019.jp2)
  10. 2-3 Historical Survey with Circuit and System Theory / p35 (0021.jp2)
  11. References / p47 (0027.jp2)
  12. Chapter 3 Fault Diagnosis of Linear Circuits / p51 (0029.jp2)
  13. 3-1 Fault-Excitation Theory / p51 (0029.jp2)
  14. 3-2 To Solve the Location Problem / p62 (0035.jp2)
  15. 3-3 To Solve the Identification Problem / p67 (0037.jp2)
  16. 3-4 Applied Example / p69 (0038.jp2)
  17. 3-5 Conclusion / p70 (0039.jp2)
  18. References / p71 (0039.jp2)
  19. Chapter 4 Fault Diagnosis of Active Circuits / p72 (0040.jp2)
  20. 4-1 Costitutive Relation of General Active Branch / p72 (0040.jp2)
  21. 4-2 Topological Analysis of Active Circuits / p74 (0041.jp2)
  22. 4-3 Diagnosis Equation for Active Circuits / p82 (0045.jp2)
  23. 4-4 Applied Example / p94 (0051.jp2)
  24. 4-5 Conclusion / p96 (0052.jp2)
  25. References / p96 (0052.jp2)
  26. Chapter 5 Fault Diagnosis of Dynamic and Nonlinear Circuits / p97 (0052.jp2)
  27. 5-1 General Idea and Principle / p97 (0052.jp2)
  28. 5-2 Solution of General Diagnosis Equation / p103 (0055.jp2)
  29. 5-3 Diagnosis for Linear Case / p104 (0056.jp2)
  30. 5-4 Diagnosis for Dynamic Case / p106 (0057.jp2)
  31. 5-5 Diagnosis for Nolinear Case / p111 (0059.jp2)
  32. 5-6 Applied Examples / p115 (0061.jp2)
  33. 5-7 Conclusion / p120 (0064.jp2)
  34. References / p121 (0064.jp2)
  35. Chapter 6 Diagnosability and Testability / p123 (0065.jp2)
  36. 6-1 The Concept of Local Diagnosability / p123 (0065.jp2)
  37. 6-2 Diagnosability and Testability of Linear Circuits / p123 (0065.jp2)
  38. 6-3 Diagnosability and Testability of Dynamic Circuits / p129 (0068.jp2)
  39. 6-4 Diagnosability and Testability of Nonlinear Circuits / p136 (0072.jp2)
  40. 6-5 A Typical Problem-Diagnosability and Testability of Single Branch Fault / p138 (0073.jp2)
  41. 6-6 Conclusion / p142 (0075.jp2)
  42. References / p143 (0075.jp2)
  43. Chapter 7 A Diagnosis Approach Based on New Fundamentals / p145 (0076.jp2)
  44. 7-1 Network Variable Equation-New Fundamentals / p145 (0076.jp2)
  45. 7-2 Analog Circuit Fault Location Approach / p153 (0080.jp2)
  46. 7-3 Analog Circuit Fault Identification Approch / p159 (0083.jp2)
  47. 7-4 Applied Example / p161 (0084.jp2)
  48. 7-5 Conclusion / p171 (0089.jp2)
  49. References / p172 (0090.jp2)
  50. Chapter 8 Summary Conclusion and Recommendation / p174 (0091.jp2)
  51. 8-1 Summary / p174 (0091.jp2)
  52. 8-2 Conlusion / p175 (0091.jp2)
  53. 8-3 Recommendation / p178 (0093.jp2)
  54. References / p180 (0094.jp2)
  55. Appendix(Publications) / (0094.jp2)
  56. Acknowledgement / (0097.jp2)
4access

Codes

  • NII Article ID (NAID)
    500000098286
  • NII Author ID (NRID)
    • 8000000098515
  • DOI(NDL)
  • NDLBibID
    • 000000262600
  • Source
    • NDL ONLINE
    • NDL Digital Collections

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