Ultrafast electro-optic measurement based on semiconductor lasers 半導体レーザを用いた超高速電気光学計測に関する研究

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著者

    • 高橋, 亮 タカハシ, リョウ

書誌事項

タイトル

Ultrafast electro-optic measurement based on semiconductor lasers

タイトル別名

半導体レーザを用いた超高速電気光学計測に関する研究

著者名

高橋, 亮

著者別名

タカハシ, リョウ

学位授与大学

東京大学

取得学位

博士 (工学)

学位授与番号

甲第9478号

学位授与年月日

1992-03-30

注記・抄録

博士論文

目次

  1. CONTENTS / p1 (0003.jp2)
  2. Chapter1 Introduction / p1 (0006.jp2)
  3. 1.1 General Motivation / p2 (0007.jp2)
  4. 1.2 Optical Sampling / p3 (0008.jp2)
  5. 1.3 Electrooptic Sampling / p4 (0009.jp2)
  6. 1.4 Background and Objective of This Work / p19 (0024.jp2)
  7. 1.5 Outline of the Thesis / p20 (0025.jp2)
  8. Chapter2 Measurement Systems Considerations and Probe Beam Polarization Modulation Scheme / p21 (0027.jp2)
  9. 2.1 Introductory Remarks / p22 (0028.jp2)
  10. 2.2 Fabrication of Desk-top Electrooptic Sampling System / p26 (0032.jp2)
  11. 2.3 Proposal of Novel Modulation Schemes / p30 (0036.jp2)
  12. 2.4 Comparative Measurement between Beat and polarization Modulation Schemes / p39 (0045.jp2)
  13. 2.5 Concluding Remarks / p43 (0049.jp2)
  14. Chapter3 Temporal Resolution Enhancement by means of Optical Pulse Compression / p44 (0050.jp2)
  15. 3.1 Introductory Remarks / p45 (0051.jp2)
  16. 3.2 Limiting Factors on Temporal Resolution / p47 (0053.jp2)
  17. 3.3 Pulse-to-pulse Timing Jitter / p50 (0056.jp2)
  18. 3.4 Optical Pulse Compression / p59 (0065.jp2)
  19. 3.5 Concluding Remarks / p79 (0085.jp2)
  20. Appendix / p79 (0085.jp2)
  21. Chapter4 Application of an Optical Amplifier to Electrooptic Sampling Systems / p81 (0087.jp2)
  22. 4.1 Introductory Remarks / p82 (0088.jp2)
  23. 4.2 Noise Characteristics of Optical Amplifiers / p83 (0089.jp2)
  24. 4.3 Theory of EO sampling Sensitivity Using an Optical Amplifier / p85 (0091.jp2)
  25. 4.4 Experimental Results on Sensitivity Improvement / p98 (0104.jp2)
  26. 4.5 Discussions / p109 (0115.jp2)
  27. 4.6 Concluding Remarks / p113 (0119.jp2)
  28. Chapter5 CW Electrooptic Probing / p115 (0120.jp2)
  29. 5.1 Introductory Remarks / p116 (0121.jp2)
  30. 5.2 Field Mapping Measurement in a GaAs Substrate / p117 (0122.jp2)
  31. 5.3 Side-Gating Effects and Potential Distribution / p125 (0130.jp2)
  32. 5.4 Concluding Remarks / p133 (0138.jp2)
  33. Chapter6 Conclusions / p134 (0139.jp2)
  34. Acknowledgements / p139 (0144.jp2)
  35. References / p142 (0147.jp2)
  36. Publications / p153 (0158.jp2)
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各種コード

  • NII論文ID(NAID)
    500000098594
  • NII著者ID(NRID)
    • 8000000098823
  • DOI(NDL)
  • NDL書誌ID
    • 000000262908
  • データ提供元
    • NDL-OPAC
    • NDLデジタルコレクション
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