Polarization measurement of synchrotron radiation with use of multilayers in the soft X-ray region 軟X線領域における多層膜を用いた放射光の偏光測定

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著者

    • 木村, 洋昭 キムラ, ヒロアキ

書誌事項

タイトル

Polarization measurement of synchrotron radiation with use of multilayers in the soft X-ray region

タイトル別名

軟X線領域における多層膜を用いた放射光の偏光測定

著者名

木村, 洋昭

著者別名

キムラ, ヒロアキ

学位授与大学

総合研究大学院大学

取得学位

博士 (理学)

学位授与番号

甲第42号

学位授与年月日

1993-03-23

注記・抄録

博士論文

目次

  1. Contents / p1 (0003.jp2)
  2. I.Introduction / p1 (0006.jp2)
  3. 1-1.Background of the research / p1 (0006.jp2)
  4. 1-2.What has been done before the present research / p2 (0007.jp2)
  5. 1-3.Methods of polarization measurement / p3 (0008.jp2)
  6. 1-4.Aim of this research / p4 (0009.jp2)
  7. II.Description of the polarization of light / p5 (0010.jp2)
  8. 2-1.The Stokes parameters / p6 (0011.jp2)
  9. 2-2.The Mueller matrices / p8 (0013.jp2)
  10. 2-3.The Poincaré sphere and the parameters of the polarization ellipse / p10 (0015.jp2)
  11. 2-4.The degree of linear and circular polarization / p14 (0019.jp2)
  12. III.Principles of measurement in the present research / p16 (0021.jp2)
  13. 3-1.Principle of rotating-analyzer ellipsometry / p16 (0021.jp2)
  14. 3-2.Multilayer polarizer and analyzer / p19 (0024.jp2)
  15. 3-3.Principle of rotating-analyzer ellipsometry with phase shifter / p23 (0028.jp2)
  16. 3-4. Multilayer phase shifter / p28 (0033.jp2)
  17. IV.How to minimize and evaluate the experimental error / p33 (0038.jp2)
  18. 4-1.Rotating-analyzer ellipsometry / p33 (0038.jp2)
  19. 4-2.Rotating-analyzer ellipsometry with phase shifter / p34 (0039.jp2)
  20. V.Design and construction of ELLI / p38 (0043.jp2)
  21. 5-1.Specifications to meet the demands / p38 (0043.jp2)
  22. 5-2.Required accuracy of the mechanism / p40 (0045.jp2)
  23. 5-3.Structure of ELLI / p41 (0046.jp2)
  24. VI.Performance of ELLI / p52 (0057.jp2)
  25. 6-1.Mechanism / p52 (0057.jp2)
  26. 6-2.Vacuum / p52 (0057.jp2)
  27. 6-3.Control system / p53 (0058.jp2)
  28. VII.Polarization measurements and the results / p54 (0059.jp2)
  29. 7-1.Beamline description / p54 (0059.jp2)
  30. 7-2.Characterization of the polarization elements / p58 (0063.jp2)
  31. 7-3.Rotating-analyzer ellipsometry with phase shifter(RAEP) / p63 (0068.jp2)
  32. 7-4.Rotating-analyzer ellipsometry(RAE)at BL-28A / p79 (0084.jp2)
  33. 7-5.Rotating-analyzer ellipsometry(RAE)at BL-18A / p83 (0088.jp2)
  34. 7-6.Rotating-analyzer ellipsometry(RAE)at SOR-RING BL-1¹ / p90 (0095.jp2)
  35. VIII.Discussion / p94 (0099.jp2)
  36. 8-1.The beamline eilipsometer ELLI / p94 (0099.jp2)
  37. 8-2.Multilayers as polarization elements / p94 (0099.jp2)
  38. 8-3.Analytical method of rotating-analyzer ellipsometry with phase shifter / p95 (0100.jp2)
  39. 8-4.The major axis of the polarization ellipse(δ)and the degree of linear polarization([数式])of the light emerging from the monochromator at a bending magnet beamline / p95 (0100.jp2)
  40. IX.Conclusion / p98 (0103.jp2)
  41. X.Acknowledgements / p100 (0105.jp2)
  42. XI.References / p101 (0106.jp2)
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各種コード

  • NII論文ID(NAID)
    500000099289
  • NII著者ID(NRID)
    • 8000000099519
  • DOI(NDL)
  • 本文言語コード
    • eng
  • NDL書誌ID
    • 000000263603
  • データ提供元
    • 機関リポジトリ
    • NDL-OPAC
    • NDLデジタルコレクション
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