Analysis of defects in liquid encapsulated Czochralski grown indium-doped GaAs crystals by two optical beam method 二光束法によるIndium-doped LEC GaAs単結晶内欠陥の研究

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著者

    • 坂井, 一文 サカイ, カズフミ

書誌事項

タイトル

Analysis of defects in liquid encapsulated Czochralski grown indium-doped GaAs crystals by two optical beam method

タイトル別名

二光束法によるIndium-doped LEC GaAs単結晶内欠陥の研究

著者名

坂井, 一文

著者別名

サカイ, カズフミ

学位授与大学

学習院大学

取得学位

博士 (理学)

学位授与番号

乙第67号

学位授与年月日

1993-03-09

注記・抄録

博士論文

目次

  1. Contents / p1 (0003.jp2)
  2. I.Introduction / p5 (0005.jp2)
  3. II.Apparatus and observations / p10 (0008.jp2)
  4. -Samples / p12 (0010.jp2)
  5. -Apparatus of light scattering tomography / p14 (0011.jp2)
  6. -Layer-by-layer tomography / p16 (0012.jp2)
  7. -Three dimensional structure of the dislocation lines / p19 (0013.jp2)
  8. III.Light scattering process / p26 (0017.jp2)
  9. IV.Determination of resonance scattering frequency by three lasers / p42 (0026.jp2)
  10. -Formulation of the resonance / p43 (0027.jp2)
  11. -Light scattering by three different beams from the same point / p45 (0028.jp2)
  12. -Calculation of the resonance frequency at and around the scatterers / p50 (0031.jp2)
  13. V.Temperature dependence of resonance frequencies and scattered intensities. / p56 (0034.jp2)
  14. -Formulation / p57 (0035.jp2)
  15. -Measurements / p58 (0036.jp2)
  16. -Determination of the resonance frequencies of the scatterers. / p60 (0037.jp2)
  17. VI.Two beam method / p68 (0041.jp2)
  18. -Concept of the two beam method to observe of the electron levels of scatterers / p69 (0042.jp2)
  19. -Apparatus of the two beam method / p72 (0044.jp2)
  20. -Scattered intensity against the power and wavelength of bias light / p76 (0046.jp2)
  21. -Distribution of electron levels around the scatterers / p83 (0049.jp2)
  22. -Measurement of the light scattered from the EL2 centers / p86 (0051.jp2)
  23. VII.Conclusion / p101 (0058.jp2)
  24. Acknowledgment / p104 (0060.jp2)
  25. References / p106 (0062.jp2)
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各種コード

  • NII論文ID(NAID)
    500000099888
  • NII著者ID(NRID)
    • 8000000100118
  • DOI(NDL)
  • NDL書誌ID
    • 000000264202
  • データ提供元
    • NDL-OPAC
    • NDLデジタルコレクション
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