Off-critical properties of diagonal scattering theories : form factor bootstrap approach 対角的散乱理論のOff-Criticalな性質 : フォームファクターブーツトラップによるアプローチ

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Author

    • 大田, 武志 オオタ, タケシ

Bibliographic Information

Title

Off-critical properties of diagonal scattering theories : form factor bootstrap approach

Other Title

対角的散乱理論のOff-Criticalな性質 : フォームファクターブーツトラップによるアプローチ

Author

大田, 武志

Author(Another name)

オオタ, タケシ

University

大阪大学

Types of degree

博士 (理学)

Grant ID

甲第5413号

Degree year

1996-03-25

Note and Description

博士論文

Table of Contents

  1. Abstract / p2 (0003.jp2)
  2. Contents / p3 (0004.jp2)
  3. 1 Introduction / p1 (0005.jp2)
  4. 1.1 Factorized S-matrix / p2 (0006.jp2)
  5. 1.2 Perturbed conformal field theories / p4 (0008.jp2)
  6. 1.3 Affine Toda field theories / p5 (0009.jp2)
  7. 2 The form factor bootstrap / p9 (0013.jp2)
  8. 2.1 Equations for the form factors / p9 (0013.jp2)
  9. 2.2 Minimal form factors / p10 (0014.jp2)
  10. 3 Examples of form factors for diagonal scattering theories / p18 (0022.jp2)
  11. 3.1 The scaling Lee-Yang model / p18 (0022.jp2)
  12. 3.2 The sinh-Gordon model / p19 (0023.jp2)
  13. 3.3 The Bullough-Dodd model([数式]) / p20 (0024.jp2)
  14. 3.4 Reduction of the SG / p20 (0024.jp2)
  15. 3.5 The magnetic perturbed Ising model / p22 (0026.jp2)
  16. 4 The [数式] case / p23 (0027.jp2)
  17. 4.1 The [0,0]-sector / p25 (0029.jp2)
  18. 4.2 The [1,0]-sector and the [0,1]-sector / p27 (0031.jp2)
  19. 5 The[数式]case / p28 (0032.jp2)
  20. 6 S-matrix formula revisited / p35 (0039.jp2)
  21. 7 Conclusions and discussion / p38 (0042.jp2)
  22. A Phenomenological Reasonings of kinematical residue equations / p40 (0044.jp2)
  23. B data / p42 (0046.jp2)
  24. B.1(Affine) Lie algebraic data / p42 (0046.jp2)
  25. B.2 Eigenvectors of the Cartan matrix / p43 (0047.jp2)
  26. B.3 Normalized Perron-Frobenius vectors / p43 (0047.jp2)
  27. C Examples / p44 (0048.jp2)
  28. C.1 [数式] / p44 (0048.jp2)
  29. C.2 [数式] / p46 (0050.jp2)
  30. C.3 [数式] / p48 (0052.jp2)
  31. C.4 D₆ / p51 (0055.jp2)
4access

Codes

  • NII Article ID (NAID)
    500000130305
  • NII Author ID (NRID)
    • 8000000954071
  • DOI(NDL)
  • Text Lang
    • und
  • NDLBibID
    • 000000294619
  • Source
    • Institutional Repository
    • NDL ONLINE
    • NDL Digital Collections
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