A "checking" system for circuits control and optimization of fluorite flotation plants 蛍石浮選工場の制御と最適化のための検査システム

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Author

    • Bissombolo, Abel ビソンボロ, アベル

Bibliographic Information

Title

A "checking" system for circuits control and optimization of fluorite flotation plants

Other Title

蛍石浮選工場の制御と最適化のための検査システム

Author

Bissombolo, Abel

Author(Another name)

ビソンボロ, アベル

University

九州大学

Types of degree

博士 (工学)

Grant ID

甲第3751号

Degree year

1996-03-27

Note and Description

博士論文

Table of Contents

  1. 論文要旨 / (0004.jp2)
  2. 論文目録 / (0006.jp2)
  3. CONTENTS / (0007.jp2)
  4. INTRODUCTION / p1 (0012.jp2)
  5. FLUORITE FLOTATION OUTLINE / p6 (0017.jp2)
  6. RESEARCH PLAN / p10 (0021.jp2)
  7. PART ONE-PRELIMINARY MINERALOGICAL INVESTIGATIONS / p12 (0023.jp2)
  8. CHAPTER 1-SAMPLING AND SIZE FRACTIONATION / p13 (0024.jp2)
  9. CHAPTER 2-PHOTOGRAPHING OF MINERALS / p25 (0036.jp2)
  10. 2.1-Preparation of minerals / p25 (0036.jp2)
  11. 2.2-Equipment / p25 (0036.jp2)
  12. 2.3-Procedure / p26 (0037.jp2)
  13. 2.4-Results of photographing / p26 (0037.jp2)
  14. CHAPTER 3-X-RAY POWDER DIFFRACTION ANALYSIS / p30 (0041.jp2)
  15. 3.1-Preparation of samples / p30 (0041.jp2)
  16. 3.2-Equipment and procedure / p31 (0042.jp2)
  17. 3.3-Results of investigations and discussion / p31 (0042.jp2)
  18. CHAPTER 4-X-RAY POWDER FLUORESCENCE ANALYSIS / p39 (0050.jp2)
  19. 4.1-Sample preparation / p39 (0050.jp2)
  20. 4.2-Research procedure / p39 (0050.jp2)
  21. 4.3-Results of investigations and discussion / p40 (0051.jp2)
  22. CHAPTER 5-ELECTRON PROBE MICRO-ANALYSIS / p46 (0057.jp2)
  23. 5.1-Sample mounting / p46 (0057.jp2)
  24. 5.2-Running EPMA / p47 (0058.jp2)
  25. 5.3-Results of investigations and discussion / p48 (0059.jp2)
  26. CHAPTER 6-CONCLUSIONS AND SUGGESTIONS / p53 (0064.jp2)
  27. PART TWO-ANALYSIS OF FLUORITE ORE AND PRODUCTS FROM AN OPERATING FLOTATION PLANT / p54 (0065.jp2)
  28. CHAPTER 1-INTRODUCTION / p55 (0066.jp2)
  29. CHAPTER 2-SAMPLING AND SAMPLE PREPARATION / p57 (0068.jp2)
  30. 2.1-Sampling / p57 (0068.jp2)
  31. 2.2-Sample preparation / p58 (0069.jp2)
  32. CHAPTER 3-WATER ANALYSIS / p61 (0072.jp2)
  33. 3.1-Introduction / p61 (0072.jp2)
  34. 3.2-Preparation of samples / p61 (0072.jp2)
  35. 3.3-Procedure and measurement / p62 (0073.jp2)
  36. 3.4-Results of analysis and discussion / p72 (0083.jp2)
  37. CHAPTER 4-CHEMICAL AND X-RAY ANALYSIS / p75 (0086.jp2)
  38. 4.1-Chemical analysis / p75 (0086.jp2)
  39. 4.2-X-ray analyses / p75 (0086.jp2)
  40. CHAPTER 5-SIEVING TESTS / p77 (0088.jp2)
  41. 5.1-Equipment / p77 (0088.jp2)
  42. 5.2-Procedure / p77 (0088.jp2)
  43. 5.3-Results of analysis and discussion / p77 (0088.jp2)
  44. CHAPTER 6-X-RAY POWDER DIFFRACTION ANALYSIS / p92 (0103.jp2)
  45. 6.1-Procedure / p92 (0103.jp2)
  46. 6.2-Results and analysis / p92 (0103.jp2)
  47. CHAPTER 7-MICROSCOPIC COUNTING AND LIBERATION ANALYSIS / p97 (0108.jp2)
  48. 7.1-Introduction / p97 (0108.jp2)
  49. 7.2-Samples preparation / p97 (0108.jp2)
  50. 7.3-Procedure and measurement / p97 (0108.jp2)
  51. 7.4-Results of analysis and discussion / p101 (0112.jp2)
  52. 7.5-Gaudin's liberation distribution analysis / p110 (0121.jp2)
  53. 7.6-Efficiency of the concentration process / p115 (0126.jp2)
  54. 7.7-Formulae for the computation of the deportment and approximate recovery / p121 (0132.jp2)
  55. CHAPTER 8-CONCLUSIONS AND SUGGESTIONS / p124 (0135.jp2)
  56. PART THREE-FULL SCALE TESTING OF AN OPERATING FLUORITE FLOTATION PLANT / p125 (0136.jp2)
  57. CHAPTER 1-INTRODUCTION / p126 (0137.jp2)
  58. CHAPTER 2-SAMPLING AND SIEVING / p128 (0139.jp2)
  59. 2.1-Sampling / p128 (0139.jp2)
  60. 2.2-Sieving / p128 (0139.jp2)
  61. CHAPTER 3-MICROSCOPIC COUNTING / p141 (0152.jp2)
  62. 3.1-Procedure and methods / p141 (0152.jp2)
  63. 3.2-Analysis of the results / p141 (0152.jp2)
  64. 3.3-Others methods of analysis / p163 (0174.jp2)
  65. 3.4-Efficiency of the separation / p163 (0174.jp2)
  66. CHAPTER 4-X-RAY DIFFRACTION ANALYSIS / p169 (0180.jp2)
  67. CHAPTER 5-CONCLUSIONS AND SUGGESTIONS / p170 (0181.jp2)
  68. CONCLUSIONS / p171 (0182.jp2)
  69. REFERENCES / p174 (0185.jp2)
  70. APPENDIX 1-STARTING AND ENDING XRD / p177 (0188.jp2)
  71. APPENDIX 2-STARTING AND ENDING XRF / p178 (0189.jp2)
  72. APPENDIX 3-ANALYZING CRISTAL/DETECTOR SELECTION CHART FOR XRF ANALYSIS / p179 (0190.jp2)
  73. APPENDIX 4-STARTING AND ENDING EPMA / p180 (0191.jp2)
  74. APPENDIX 5-TABLES FOR DETECTED POSITION OF CHARACTERISTIC X-RAY FOR EPMA / p182 (0193.jp2)
  75. APPENDIX 6-PRINCIPLES OF THE “CHECKING” SYSTEM MODEL / p185 (0196.jp2)
  76. LIST OF FIGURES AND PLATES / p188 (0199.jp2)
  77. LIST OF TABLES / p192 (0203.jp2)
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Codes

  • NII Article ID (NAID)
    500000131511
  • NII Author ID (NRID)
    • 8000000131782
  • DOI(NDL)
  • NDLBibID
    • 000000295825
  • Source
    • NDL ONLINE
    • NDL Digital Collections

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