Temperature distributions produced in semiconductors by a scanning elliptical or circular cw laser beam

• NISSIM YI.

収録刊行物

• J Appl Phys

  J Appl Phys 51 274-279, 1980

詳細情報

• CRID: 1572824501320267520
• NII論文ID: 80000462633
• NII書誌ID: AA00693547
• データソース種別:
  • CiNii Articles