Electrical properties and defect model of tin-doped indium oxide layers
Journal
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- Appl. Phys., A
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Appl. Phys., A 27 (4), 197-206, 1982
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Details 詳細情報について
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- CRID
- 1572824498910865792
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- NII Article ID
- 80001215159
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- Data Source
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- CiNii Articles