Measurement of Adherence of Residually Stressed Thin Films by Indentation. I. Mechanics of Interface Delamination
Journal
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- Journal of Applied Physics
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Journal of Applied Physics 56 2632-2638, 1984
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Details 詳細情報について
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- CRID
- 1573387451467016320
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- NII Article ID
- 80002302073
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- Data Source
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- CiNii Articles