Inhibited dark-line defect formation in strained InGaAs/AlGaAs quantum well lasers

• R.G. Waters

• D.P. Bour

• S.L. Yellen

• N.F. Ruggieri

収録刊行物

• IEEE Photonics Technology Letters

  IEEE Photonics Technology Letters 2 (8), 531-533, 1990-08

  Institute of Electrical and Electronics Engineers (IEEE)

キーワード

• Electrical and Electronic Engineering
• Atomic and Molecular Physics, and Optics
• Electronic, Optical and Magnetic Materials

詳細情報

• CRID: 1361981470708061184
• NII論文ID: 80005353373
• DOI: 10.1109/68.58039
• ISSN: 19410174
• ISSN: 10411135
• Web Site: http://xplorestaging.ieee.org/ielx3/68/2107/00058039.pdf?arnumber=58039
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  • CiNii Articles