Silicon Lattice Measurement with an Improved X-Ray/Optical Interferometer

• NAKAYAMA K.

収録刊行物

• IEEE Trans.

  IEEE Trans. 42 401-403, 1993

詳細情報

• CRID: 1572543026550624384
• NII論文ID: 80007211303
• NII書誌ID: AA00668164
• データソース種別:
  • CiNii Articles