Dielectric Breakdown of a Residual SF6 Plasma at 3 000K under Diatomic Equilibrium

• YAN J. D.

収録刊行物

• IEEE Tr. on Dielectrics and Electrical Insulation

  IEEE Tr. on Dielectrics and Electrical Insulation 4 (1), 114-119, 1997

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• CRID: 1572261550711823616
• NII論文ID: 80009606605
• データソース種別:
  • CiNii Articles