A selective-epitaxial SiGe HBT with SMI electrodes featuring 9.3-ps ECL-gate delay

Journal

IEDM Tech. Digest  

IEDM Tech. Digest, 795-798, 1997 

Cited by:  4

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Codes

  • NII Article ID (NAID) :
    80010507273
  • NII NACSIS-CAT ID (NCID) :
    BA12393083
  • Article Type :
    Other
  • Databases :
    CJPref 

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