Influence of Interrupted Current Recovery After Current Zero-Experiment and Simulation

• HULER Eduard F.-J.

収録刊行物

• IEEE Trans. Plasma Sci.

  IEEE Trans. Plasma Sci. 27 930-937, 1999

詳細情報

• CRID: 1572543026596991872
• NII論文ID: 80011281529
• データソース種別:
  • CiNii Articles