3D Micro-Profile Measurement using Optical Inverse Scattering Phase Method
Journal
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- Annals of the CIRP
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Annals of the CIRP 49 423-427, 2000
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Details 詳細情報について
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- CRID
- 1573105976552234368
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- NII Article ID
- 80011816353
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- Data Source
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- CiNii Articles