A durable, shock-resistant electromagnetic optical scanner with polyimide-based hinges

• H. Miyajima

• N. Asaoka

• M. Arima

• Y. Minamoto

• K. Murakami

• K. Tokuda

• K. Matsumoto

収録刊行物

• Journal of Microelectromechanical Systems

  Journal of Microelectromechanical Systems 10 (3), 418-424, 2001

  Institute of Electrical and Electronics Engineers (IEEE)

キーワード

• Electrical and Electronic Engineering
• Mechanical Engineering

詳細情報

• CRID: 1363388846095916800
• NII論文ID: 80012558574
• DOI: 10.1109/84.946797
• ISSN: 10577157
• Web Site: http://xplorestaging.ieee.org/ielx5/84/20498/00946797.pdf?arnumber=946797
• データソース種別:
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  • CiNii Articles