Accurate in-situ measurement of noise peak and delay induced by interconnect coupling

9 Citations

Journal

  • IEEE JSSC

    IEEE JSSC 36 (10), 1587-1591, 2001

Citations (9)*help

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Details 詳細情報について

  • CRID
    1570572700088344832
  • NII Article ID
    80012719983
  • Data Source
    • CiNii Articles

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