Profile fitting : A powerful Method of Computer X-ray Instrumentation and Analysis

• PARRISH W.

Journal

• Trans. Am. Crystallogr. Assoc.

  Trans. Am. Crystallogr. Assoc. 12 55-73, 1976

Details

• CRID: 1572824501322198144
• NII Article ID: 80013767058
• Data Source:
  • CiNii Articles