An overview on the state-of-art piezoelectric measurements of thin films

• LIU J.-M.

収録刊行物

• Mat. Chem. and Phys.

  Mat. Chem. and Phys. 75 12-18, 2002

詳細情報

• CRID: 1573387451547109248
• NII論文ID: 80015215488
• データソース種別:
  • CiNii Articles