Aberration-corrected scanning transmission electron microscopy : the potential for nano- and interface science
収録刊行物
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- Zeitschrift Fur Metallkunde
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Zeitschrift Fur Metallkunde 94 350-357, 2003
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詳細情報
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- CRID
- 1570009751821190016
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- NII論文ID
- 80015854355
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- データソース種別
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- CiNii Articles