Efficient test access mechanism optimization for system-on-chip

Journal

IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.  

IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 22(5), 635-643, 2003 

Cited by:  1

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Codes

  • NII Article ID (NAID) :
    80015914456
  • Article Type :
    Journal Article
  • Databases :
    CJPref 

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