Test Access Mechanism Optimization, Test Scheduling, and Tester Data Volume Reduction for System-on-Chip

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Journal

IEEE Trans. On Computers  

IEEE Trans. On Computers 52(12), 1619-1632, 2003 

Cited by:  8

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Codes

  • NII Article ID (NAID) :
    80016370439
  • Article Type :
    Journal Article
  • Databases :
    CJPref 

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