Current fluctuation in single-hole transport through a two-dimensional Si multidot

• NURYADI R.

収録刊行物

• Applied Physics Letters

  Applied Physics Letters 86 (13), 133106-133106, 2005-03-22

  American Institute of Physics

詳細情報

• CRID: 1571980076404146816
• NII論文ID: 80017471076
• NII書誌ID: AA00543431
• ISSN: 00036951
• Web Site: http://hdl.handle.net/10297/2530
• 本文言語コード: en
• データソース種別:
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