The contribution of field-induced morphological change to the electrical aging and breakdown of polyethylene
収録刊行物
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- IEEE Transactions on Dielectrics and Electrical Insulation
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IEEE Transactions on Dielectrics and Electrical Insulation 12 (5), 951-966, 2005-10
Institute of Electrical and Electronics Engineers (IEEE)
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詳細情報 詳細情報について
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- CRID
- 1363107370891286016
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- NII論文ID
- 80017508897
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- ISSN
- 10709878
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- データソース種別
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- Crossref
- CiNii Articles