書誌事項

IEEE design & test of computers

IEEE Computer Society [and] the Institute of Electrical and Electronics Engineers, Inc

IEEE Computer Society, c[1984]-2012

  • Vol. 1, no. 1 (Feb. 1984)-v. 29, no. 6 (Nov./Dec. 2012)

タイトル別名

IEEE des. test comput (Print)

IEEE design & test of computers (Print)

IEEE design and test of computers

Design & test of computers

Design and test of computers

IEEE design & test

Institute of Electrical and Electronics Engineers design and test of computers

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注記

Title from cover

Vol. 1, no. 1 also called premiere issue

Issued also in microfiche

Quarterly, 1984; bimonthly, 1985-

Place of publication varies: New York, N.Y.

継続後誌:1件

  • IEEE design & test

    IEEE

    Institute of Electrical and -Electronics -Engineers 2013-

    所蔵館3館

詳細情報

  • NII書誌ID(NCID)
    AA10630714
  • ISSN
    07407475
  • LCCN
    91641150
  • 出版国コード
    us
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    [Los Alamitos, Calif.]
  • 出版状況
    廃刊
  • 刊行頻度
    隔月刊
  • 定期性
    定期
  • 逐次刊行物のタイプ
    定期刊行物
  • 雑誌変遷マップID
    42187900
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