Bibliographic Information

IEEE International Reliability Physics Symposium proceedings

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

IEEE, c1997-

  • 35th (Apr. 8/9/10, 1997)-

Available at  / 4 libraries

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Details

  • NCID
    AA11164286
  • LCCN
    97038118
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Piscataway, N.J.
  • Publication Status
    Currently Published Status
  • Frequency
    Annual
  • Regularity
    Regular
  • Bibliographic History ID
    40781500
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