Proceedings of the Second Symposium on Defects in Silicon : defects in silicon II

著者

• Symposium on Defects in Silicon
• Bullis, W. Murray
• Gösele, Ulrich
• Shimura, Fumio
• Electrochemical Society. Electronics Division
• Electrochemical Society. Dielectric Science and Technology Division

書誌事項

Proceedings of the Second Symposium on Defects in Silicon : defects in silicon II

edited by W. Murray Bullis, Ulrich Gösele, Fumio Chimura ; assistant editors, W. Bergholz ... [et al.] ; Electronics and Dielectric Science and Technology Divisions

（Proceedings / [Electrochemical Society], v. 91-9）

Electrochemical Society, c1991

注記

Includes bibliographical references and indexes

詳細情報

• NII書誌ID(NCID): BA13248137
• LCCN: 91075566
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Pennington, NJ (10 S. Main St., Pennington 08534-2896)
• ページ数/冊数: xi, 692 p.
• 大きさ: 23 cm
• 分類:
  • LCC : QC611.8.S5
  • DC19 : 621.381/73
• 件名:
  • LCSH : Silicon -- Defects -- Congresses
  • LCSH : Semiconductors -- Defects -- Congresses
• 親書誌ID:
  • BA01323290