Critical phenomena at surfaces and interfaces : evanescent X-ray and neutron scattering

書誌事項

Critical phenomena at surfaces and interfaces : evanescent X-ray and neutron scattering

Helmut Dosch

(Springer tracts in modern physics : Ergebnisse der exakten Naturwissenschaften / editor, G. Höhler, v. 126)

Springer-Verlag, c1992

  • : gw
  • : us

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注記

Bibliography: p. 133-141

Includes index

内容説明・目次

内容説明

Much progress has been made in the understanding of critical phenomena at surfaces and interfaces as a result of the novel experimental technique of grazing angle x-ray and neuron scattering, and theoretical concepts and predictions such as surface-induced order and disorder. This volume treats the scattering of evanascent x-ray and neutron waves inside a solid. Particular emphasis is put on the use of this technique to extract microscopic information from the real structure of a surface, from buried and magnetic interfaces and from surface roughness.

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  • Springer tracts in modern physics : Ergebnisse der exakten Naturwissenschaften

    editor, G. Höhler

    Springer-Verlag 1965-

    v. 38 , v. 39 , v. 40 , v. 41 , v. 42 , v. 43 , v. 44 , v. 45 , v. 46 , v. 47 , v. 48 , v. 49 , v. 50 , v. 51 , v. 52 , v. 53 , v. 54 , v. 55 , v. 56 , v. 57 , v. 58 , v. 59 , v. 60 , v. 61 , v. 62 , v. 63 , v. 64 , v. 65 , v. 66 , v. 67 , v. 68 , v. 69 , v. 70 , v. 71 , v. 72 , v. 73 , v. 74

    所蔵館95館

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