Industrial applications of holographic nondestructive testing : May 3-5, 1982, Brussels

著者

• Ebbeni, J.
• Society of Photo-optical Instrumentation Engineers
• Association belge pour l'étude, l'essai et l'emploi des matériaux

書誌事項

Industrial applications of holographic nondestructive testing : May 3-5, 1982, Brussels

chairman/editor: J. Ebbeni ; sponsored by SPIE--the International Society for Optical Engineering ; with the support of Association belge pour l'étude, l'essai et l'emploi des matériaux (ABEM) ... [et al.]

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 349）

S.P.I.E.-- the International Society for Optical Engineering, 1982

• pbk.

注記

Includes bibliographical references and indexes

詳細情報

• NII書誌ID(NCID): BA23938095
• ISBN:
  • 0892523840
• LCCN: 82061899
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: vi, 199 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TA1540
  • DC19 : 620.1/127
• 件名:
  • LCSH : Holographic testing -- Congresses
• 親書誌ID:
  • BA0022700X