Tests, measurements, and characterization of electro-optic devices and systems, 8 September 1989, Boston, Massachusetts

著者

• Wadekar, Shekhar G.
• Society of Photo-optical Instrumentation Engineers
• New Mexico State University. Applied Optics Laboratory

書誌事項

Tests, measurements, and characterization of electro-optic devices and systems, 8 September 1989, Boston, Massachusetts

Shekhar G. Wadekar, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... [et al.]

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 1180）

SPIE, c1990

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA24456293
• ISBN:
  • 0819402168
• LCCN: 89043443
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: vi, 196 p.
• 大きさ: 28 cm
• 親書誌ID:
  • BA0022700X