Optical testing and metrology III : recent advances in industrial optical inspection : 8-13 July 1990, San Diego, California

著者

• Grover, C. P.
• Society of Photo-optical Instrumentation Engineers
• International Symposium on Optical and Optoelectronic Applied Science and Engineering

書誌事項

Optical testing and metrology III : recent advances in industrial optical inspection : 8-13 July 1990, San Diego, California

C.P. Grover, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 1332）

SPIE, c1990

• : pt. 1
• : pt. 2

注記

"Part of a six-conference program on Optical Design and Fabrication held at SPIE's International Symposium on Optical and Optoelectronic Applied Science and Engineering, 8-13 July 1990, San Diego, California"--P. x

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA25651443
• ISBN:
  • 0819403938
  • 0819403938
• LCCN: 90052826
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash., USA
• ページ数/冊数: 2 v.
• 大きさ: 28 cm
• 分類:
  • LCC : T50
  • DC20 : 681/.2
• 件名:
  • LCSH : Mensuration -- Congresses
  • LCSH : Optical measurements -- Congresses
• 親書誌ID:
  • BA0022700X