Practical guide to infrared microspectroscopy
著者
書誌事項
Practical guide to infrared microspectroscopy
（Practical spectroscopy, v. 19）
Marcel Dekker, c1995
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注記
Includes bibliographical references and index
内容説明・目次
内容説明
This work represents a sound introduction to the fundamental principles of infrared microspectroscopy (IMS). It describes how IMS is used to solve specific microanalytical problems in a variety of disciplines, including forensic analysis, art conservation, and geological, pharmaceutical and electronics research. The book discusses when and how to use special techniques such as line scanning, 3-dimensional imaging and attenuated total reflection and grazing-angle spectroscopy.
目次
- Minimizing optical nonlinearities in infrared microspectroscopy
- uniting microscopy and spectroscopy
- infrared microimaging
- application of reflectance microspectroscopy in the electronics industry
- depth profiling and defect analysis of films and laminates - an industrial approach
- infrared microspectroscopy of forensic paint evidence
- forensic examination of textile fibers by infrared microspectroscopy
- infrared microspectroscopy analysis of cultural artifacts
- pharmaceutical applications of infrared microspectroscopy
- infrared microspectroscopy in the geosciences with emphasis on long wavelengths and high pressures
- unique preparation techniques for nanogram samples
- sample preparation techniques for microsamples.
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