Economics of design and test for electronic circuits and systems

著者

    • Ambler, A.
    • Abadir, M.
    • Sastry, Sarma
    • International Workshop on the Economics of Design and Test (1st : 1991 : Austin, Tex.)

書誌事項

Economics of design and test for electronic circuits and systems

editors, A.P. Ambler, M. Abadir, S. Sastry

（Ellis Horwood series in workshops）

E. Horwood, 1992

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注記

"Papers presented at the First International Workshop on the Economics of Design and Test, held at MCC, Austin, Texas in September 1991"--Introd

Includes bibliographical references and index

内容説明・目次

内容説明

Containing the edited proceedings of the First International Workshop on the Economics of Design and Test (sponsored by ACM SIGDA), this book discusses and explores current and future test trends, showing how they are driven by the economics of delivering ever-increasingly complex microelectric systems. The main thrust of the book is on the economical impact of those test decisions which are directly associated with the design, manufacture or field maintenance of integrated circuits, boards or systems.

目次

  • Evaluating cost, schedule and quality issues of a multi-chip through simulation
  • DOM - a Defect Occurrence Model for evaluating the life cycle costs of text strategies
  • concurrent information systems engineering and quality control with CFS
  • hierarchical testability analysis and test generation using functional modelling - a solution to test design bottleneck
  • aspects of design quality models
  • economical test sets for bridging faults on printed circuit boards
  • a concurrent design for test metric
  • the use of scan paths in the debugging and testing of the Epsilon-2 research computer
  • the economics of designing testability into an existing microprocessor board
  • economics of ASIC test development
  • EDIF test view - a proposed industry standard for test data interchange
  • dynamic predictive testing based on regression analysis in manufacturing processes
  • a strategy for an enhanced reliability improvement process
  • economical test aspects associated with laser-programmable multichip module technology
  • Cheops - cost driven heuristic for partial scan generation
  • the application of analytical cost models for optimization of field service strategies
  • test cost modelling techniques and use
  • implementing and managing a 1149 program.

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