2002 IEEE AUTOTESTCON proceedings, Systems Readiness Technology Conference : the new millennium challenge-transforming test

著者

• Autotestcon
• IEEE Aerospace and Electronic Systems Society
• IEEE Instrumentation and Measurement Society
• IEEE Huntsville Section

書誌事項

2002 IEEE AUTOTESTCON proceedings, Systems Readiness Technology Conference : the new millennium challenge-transforming test

sponsored by the Institute of Electrical and Electronics Engineers, Aerospace and Electronics Systems Society, Instrumentation and Measurement Society, IEEE Huntsville Section

IEEE Service Center, c2002

タイトル別名

Systems Readiness Technology Conference proceedings, AUTOTESTCON 2002, Huntsville Alabama

AUTOTESTCON 2002

注記

"IEEE catalog no. 02CH37350"

詳細情報

• NII書誌ID(NCID): BA5930648X
• ISBN:
  • 078037441X
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway, NJ
• ページ数/冊数: xxxi, 919 p.
• 大きさ: 28 cm