Optoelectronic metrology : 28-30 September 1998, Ĺańcut, Poland

著者

• Owsik, Jan
• Więcek, Tomasz

書誌事項

Optoelectronic metrology : 28-30 September 1998, Ĺańcut, Poland

Jan Owsik, Tomasz Więcek,editors ; Wojciech Skrzeczanowski, Ewa Burdziakowska, co-editors ; organized by Institute of Optoelectronics, Military University of Technology, Warsaw(Poland), Central Office of Measures, Warsaw(Poland), Foundation for Industrial and Environmental Science, Rzeszów(Poland)

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 4018）

SPIE, c1998

• : pbk

詳細情報

• NII書誌ID(NCID): BA60203112
• ISBN:
  • 0819436445
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash., USA
• ページ数/冊数: xiv, 152 p.
• 大きさ: 28 cm
• 親書誌ID:
  • BA0022700X