Scanning probe microscopy techniques
Author(s)
Bibliographic Information
Scanning probe microscopy techniques
（Nanoscience and technology, . Applied scanning probe methods ; 5）
Springer, c2007
Available at / 7 libraries
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The Institute for Solid State Physics Library. The University of Tokyo.図書室
549.5:A2:57210256918
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Note
Includes bibliographical references and index
Description and Table of Contents
Description
The volumes V, VI and VII will examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. This is the first book summarizing the state-of-the-art of this technique. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Table of Contents
Integrated Cantilevers and Atomic Force Microscopes.- Electrostatic Microscanner.- Low-Noise Methods for Optical Measurements of Cantilever Deflections.- Q-controlled Dynamic Force Microscopy in Air and Liquids.- High-Frequency Dynamic Force Microscopy.- Torsional Resonance Microscopy and Its Applications.- Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy.- Combined Scanning Probe Techniques for In-Situ Electrochemical Imaging at a Nanoscale.- New AFM Developments to Study Elasticity and Adhesion at the Nanoscale.- Near-Field Raman Spectroscopy and Imaging.
by "Nielsen BookData"
